
Dell, Intel and Altair have collaborated to analyze a virtual drop test solution with integrated simulation and optimization analysis, delivering proven gains in speed and accuracy. With this solution, engineers can explore more design alternatives for improved product robustness and reliability. As a result, manufacturers can significantly reduce the time to develop high-performing designs, improving product quality while minimizing time to delivery.
Guest speakers include Stephan Gillich from Intel, Martin Hilgeman from Dell, and Eric Lequiniou from Altair.
Download the Collaboration Report * Download the MP3 * Subscribe on iTunes * Subscribe on Stitcher * RSS Feed
Sign up for our insideHPC Newsletter.